三浦 幸也(ミウラ ユキヤ) 2009年度
研究業績
学会発表
Current Testable Design of Resistor String DACs for Short Defects, Proc. 24th International Technical Conference on Circuits/Systems, Computers and Communications, A-16-0700, 2009-7.
A Circuit Failure Prediction Mechanism (DART) for High Field Reliability, Proc. of the 8th IEEE International Conference on ASIC, pp.581-584, 2009-10.
劣化検知テストにおけるパス選択について, デザインガイア2009, 2009-12.
A Path Selection Method for Delay Test Targeting Transistor Aging, Proc. of First IEEE International Workshop on Reliability Aware System Design and Test (RASDAT'10), pp.57-61, 2010-1.
論文発表
A Feasibility Study of Active Current Testing, Yukiya Miura, Information Technology Letters, Forum on Information Technology 2009,RC-014, pp.211-216, 2009-9.
対外的な諸活動
学会活動
電子情報通信学会ソサイエティ論文誌編集委員会, 査読委員.
電子情報通信学会英文論文誌特集号, 編集委員.
IEEE European Test Symposium, Program Committee 委員.
Design, Automation and Test in Europe Conference, Program Committee委員.