R. Sato and S. Fukumoto, ``Analysis for Controller Area Networks With Randomly Occurring Messages,'' IEEE Transactions on Vehicular Technology, Vol.69, Issue 4, pp.3893-3902, April 2020.
Y. Nagamura, T. Ide, M. Arai, S. Fukumoto, ``CNN-based Layout Segment Classification for Analysis of Layout-induced Failures," IEEE Transactions on Semiconductor Manufacturing, Vol. 33, No.4, pp. 597-605, 2020.
Y. Nagamura, K.Arima, M. Arai, S. Fukumoto, ``Layout Feature Extraction using CNN Classification in Root Cause Analysis of LSI Defects,'' IEEE Transactions on Semiconductor Manufacturing, early access, 2021.
IEEE Transactions on Semiconductor Manufacturing に掲載された論文 ``CNN-based Layout Segment Classification for Analysis of Layout-induced Failures" が,同論文誌の2020年 Best Paper Award competition における Honorable Mention を受賞 (2020 年に掲載された106件の論文の第2位)