新井 雅之(アライ マサユキ) 2010年度
研究業績
学会発表
[1] S. Fukumoto, H. Kurokawa, M. Arai, and K. Iwasaki, "Stochastic and Statistical Analyses of the Distribution of Fault Coverage in Random-Pattern Testing," International Symposium on Communications and Information Technology, ThA1-3-3, Oct. 2010.
[2] M. Arai, Y. Tabata, and K. Iwasaki, "Study on Insertion Point and Area Observation Circuit for On-Chip Debug Technique," Workshop on RTL and High Level Testing, pp. 47-50, Dec. 2010.
[3] T. Ikeda, M. Ohhara, S. Fukumoto, M. Arai, and K. Iwasaki, "A Distributed Data Replication Protocol for File Versioning with Optimal Node Assignments," Pacific Rim International Symposium on Dependable Computing, pp. 117-124, Dec. 2010.
論文発表
[1] M. Arai, T. Endo, K. Iwasaki, M. Nakao, and I. Suzuki, “Reduction of Area per Good Die for SoC Memory Built- In Self-Test,” IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, Vol. E93-A, No. 12, pp. 2463-2471, Dec. 2010.