Yukiya Miura and Yoshihiro Ohkawa, Dependable Techniques for Noise Block and Delay Detection/CorrectionInformation, Technology Letters, Forum on Information Technology 2012, RC-003, pp.39-44, Septmber 2012.
学会発表(国内)
Yukiya Miura, On-chip Temperature and Voltage measurement for Field Testing, IEEE European Test Symposium, March 2012.
Yasuo Sato, Seiji Kajihara, Michiko Inoue, Yukiya Miura, Satoshi Ohtake, DART: Dependable VLSI Test Architecture and Its Implementation, International Test Conference, November 2012.
Yoshihiro Ohkawa and Yukiya Miura, Dual Edge Triggered Flip-Flops for Noise Blocking and Application to Signal Delay Detection, Asian Test Symposium, November 2012.