"Cross-Sectional TEM Characterization of the intermediate layers in Ni‐Mg2Si Thermoelectric device prepared by SPS method”, H.Sugawara, S. Nakamura, S. Nakamura, Y. Mori, K. Takarabe, 34th annual International Conference on Thermoelectrics, and 13th European Conference on Thermelectrics, SA2 (口頭発表) June 28-July 2, 2015 Desden, Germany